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Imaging fungal deterioration of wood using x-ray microtomography
1997 - IRG/WP 97-10240
Nondestructive tomographic images of solid Southern yellow pine (SYP) wood and SYP during deterioration by wood decay fungi were obtained by using a new class of synchrotron X-ray computed microtomography (CMT). The CMT images will provide information about spatial relationship between degrading fungi and wood structures. Wood samples were scanned with synchrotron-generated X-rays at high resoluti...
B Illman, B A Dowd