Imaging fungal deterioration of wood using x-ray microtomography
B Illman, B A Dowd
Nondestructive tomographic images of solid Southern yellow pine (SYP) wood and SYP during deterioration by wood decay fungi were obtained by using a new class of synchrotron X-ray computed microtomography (CMT). The CMT images will provide information about spatial relationship between degrading fungi and wood structures. Wood samples were scanned with synchrotron-generated X-rays at high resolution (3 microns) using Charge Coupled Device (CCD) area detectors. The CCD detector array optimizes reconstruction algorithms with 329 x 259 small pixels where 1 row of pixels constitutes a single 2-dimensional slice of a specimen. A total of 500 horizontal slices comprising each data set were stacked to reconstruct a 3-dimensional volume of the specimen. Color images were computer-generated in 2-dimension to portray single slices of select cross or tangential sections and 3-dimensional volumes of the wood. Reconstructed volumes can be viewed on 3-dimensional video by fiber optic link to a 3-dimensional stereo viewing theater. The CMT model developed in this work will provide needed information about the chronology and location of structural damage to wood and aid in determining the chemical mechanisms of lignocellulose degradation.